High spatial resolution Kelvin probe force microscopy with coaxial probes
نویسندگان
چکیده
منابع مشابه
High spatial resolution Kelvin probe force microscopy with coaxial probes.
Kelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force. The spatial resolution of KPFM is intrinsically limited by the long range of the electrostatic interaction, which includes contributions from the macroscopic cantilever and the conical tip. Here, we prese...
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ژورنال
عنوان ژورنال: Nanotechnology
سال: 2012
ISSN: 0957-4484,1361-6528
DOI: 10.1088/0957-4484/23/11/115703